Impact of Relaxation on the Performance of GeSe True Random Number Generator Based on Ovonic Threshold Switching

Volatile Ovonic threshold switching (OTS) are promising not only as the selector in crossbar resistive memory arrays, but also true random number generators (TRNG) by utilizing its probabilistic characteristics. However, investigation on reliability of OTS-based TRNG is still lacking, which hinders practical application. Previously, we found that probability dependent pulse amplitude and width. In this work, report relaxation happens during time interval between pulses can cause drift. Optimizing bit-generation waveform modulating conditions could provide a solution, addition to impact external bias temperature. This work provides useful guidance for design operation TRNGs.